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Byung-Hyuk Jun 1 Articles
131 Influence of the Thin-Film Ag Electrode Deposition Thickness on the Current Characteristics of a CVD Diamond Radiation Detector
Chae-Min Ban, Chul-Yong Lee, Byung-Hyuk Jun
J. Radiat. Prot. Res. 2018;43(4):131-136.   Published online December 31, 2018
DOI: https://doi.org/10.14407/jrpr.2018.43.4.131
                              
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