Soybean plants were exposed to HTO vapor in an exposure box for 1 hour at different growth stages. Relative concentrations of TFWT at the end of exposure (percent ratios of TFWT concentrations to mean HTO concentrations in air moisture in the box during exposure) decreased on the whole in the order of leaf > shell > seed > stem with the highest values of 40.2% and 6.4% for leaf and stem, respectively. TFWT concentrations reduced by factors of several thousands to several hundred-thousands from the end of exposure till the harvest. The reduction factor decreased in the order of leaf > shell > seed > stem. Relative OBT concentrations at harvest (ratios of the OBT concentration in the dry plant part at harvest to the initial leaf TFWT concentration, ml $g^{-1}$) were in the range of $2.2{times}10^{-5}{sim}9.5{times}10^{-3}$ for seeds being the highest when the exposure was performed at the actively seed-developing stage. The exposure time-dependent variation in the OBT concentration was much greater in seeds and shells than in leaves and stems. It was indicated that OBT would contribute to almost all the radiation dose due to the consumption of soybean seeds in most cases after an acute exposure of growing plants to HTO vapor. Present results are applicable to establishing and validating soybean $^3H$ models for an acute accidental release of HTO.
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