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J. Radiat. Prot. Res > Volume 40(2); 2015 > Article
Journal of Radiation Protection and Research 2015;40(2):87-0.
doi: https://doi.org/10.14407/jrp.2015.40.2.087
XPS STUDY ON THE EFFECT OF LOW-ENERGY ELECTRON IRRADIATION ON DNA DAMAGE BY Fe3+ ION
Noh, Hyung-Ah;Park, Yeun-Soo;Cho, Hyuck;
ABSTRACT
We have employed X-ray photoelectron spectroscopy (XPS) technique to examine the combined effects of low-energy electron (LEE) irradiation and $Fe^{3+}$ ion on DNA damage. pBR322 plasmid DNA extracted from E. coli ER2420 was used for preparing DNA-$Fe^{3+}$ sample. The C1s XPS spectra were scanned for LEE-irradiated and LEE-unirradiated samples and then curve-fitted. For the samples with LEE irradiation only or with Fe ion only, no significant changes from pure DNA samples were observed - a single effect of either $Fe^{3+}$ ion or LEE irradiation did not cause a significant damage. However, when these two components were combined, the DNA damage was increased quite significantly, compared to the sum of DNA damages caused by $Fe^{3+}$ ion and by LEE irradiation independently. This observation is consistent with our previous results [Radiat. Res. 177, 775 (2012)] which was done using gel-electrophoresis technique. Partial interpretation of the observed spectrum peaks was also attempted.
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XPS STUDY ON DNA DAMAGE BY LOW-ENERGY ELECTRON IRRADIATION  2011 ;36(4)
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